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13th Workshop on Combined Analysis Using Ray Scattering

juillet 3 - juillet 6

13th workshop on Combined Analysis using ray scattering

CRISMAT UMR 6508 organizes the 13th workshop on Combined Analysis Using Ray Scattering

đź“Ť July 3rd – 7th, 2023 Caen (France)

Objectives

This intemational school covers many aspects of the “Combined Analysis” methodology using x-Ray, neutron and electron scattering, and X-ray fluorescence applied to material science. Fundamental to technical aspects relevant to industrial and academic applications are targeted.

The combined analysis method Is developed for more than 20 years. Ground on the whole pattem fitting using the Rietveld method, it incorporates texture, microstructure, phase, layering, residual stress analyses. together with X-ray reflectivity and fluorescence and electron diffraction

The aim is to give students. academic and non-academic researchers the necessary tools to be able to characterize their own samples using the Combined Analysis method and the software MAUD. The characterization involves obtaining information on the structure, microstructure, phase and elemental content, texture, stress in different kind of samples and structures including: thin films, bulk materials, anisotropic materials, poly-phased materials, nano-materials, etc.

The objective is to bring together participants trom various fields and to provide an opportunity to discuss individual interests and experience.

Topics

Each type of analysis will be considered individually for the proper technique and then integrated into the MAUD

Combined Analysis software. Some specific examples will be studied using X-Ray and neutron experimental data.

  • Diffraction techniques, overview
  • Crystallographic Texture Analysis
  • Residual Stress Analysis
  • Rietveld analysis
  • Reflectivity analysis
  • Phase analysis
  • Line broadening analysis
  • XRD & XRF combined analysis

Pre-requisites

  • Basic knowledge of crystallography and diffraction techniques
  • Good practice in the use of computers
  • Your laptop for the practicals

MAUD (Materials Analysis Using Diffraction):  http://maud.radiographema.eu/

Informations link: http://www.ecole.ensicaen.fr/~chateign/formation/

Registration link: registration begins 13th March

French: https://www.azur-colloque.fr/DR16/inscription/inscription/21/fr

English: https://www.azur-colloque.fr/DR16/inscription/inscription/21

 

 

 

WORKSHOP on Combined Analysis Using Ray Scattering

WORKSHOP on Combined Analysis Using Ray Scattering

DĂ©tails

Début :
juillet 3
Fin :
juillet 6
Site :
http://www.ecole.ensicaen.fr/~chateign/formation/

Lieu

CRISMAT
6 boulevard du Maréchal Juin
Caen, Normandie 14150
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Téléphone :
02 31 45 25 03
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